Influence of annealing on structural and
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Devi, V. Lakshmi ;Jyothi, I. ;Reddy, V. Rajagopal ;Choi, Chel-Jong
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Article
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2011
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John Wiley and Sons
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English
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## Abstract In this article, we have investigated the effects of rapid thermal annealing on the electrical and structural properties of Ru/Cu Schottky contacts on nβInP by current densityβvoltage (__J__β__V__), capacitanceβvoltage (__C__β__V__), Secondary ion mass spectrometer (SIMS) and Xβray diff