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Preparation and electrical properties of thin native oxide double-layer insulator films on n-type InP

✍ Scribed by Bouchikhi, B. ;Michel, C. ;Ravelet, S. ;Lepley, B.


Publisher
John Wiley and Sons
Year
1987
Tongue
English
Weight
790 KB
Volume
101
Category
Article
ISSN
0031-8965

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## Abstract In this article, we have investigated the effects of rapid thermal annealing on the electrical and structural properties of Ru/Cu Schottky contacts on n‐InP by current density–voltage (__J__–__V__), capacitance–voltage (__C__–__V__), Secondary ion mass spectrometer (SIMS) and X‐ray diff