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Preparation and characterization of polycrystalline ZnSxSe1−x films prepared by a two-zone hot wall technique

✍ Scribed by P Gupta; D Bhattacharyya; S Chaudhuri; A.K Pal


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
820 KB
Volume
221
Category
Article
ISSN
0040-6090

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## Abstract Two‐source thermal evaporation technique was used to prepare Hg~x~Cd~1‐x~Te thin films onto scratch free transparent glass substrates. The structural investigations revealed that thin films were polycrystalline in nature. Transmittance measurements in the wavelength range (500‐2700 nm)