Laser Raman spectroscopy (LRS), X-ray di4raction (XRD), X-ray photoelectron spectroscopy (XPS), ultraviolet and di4use re6ectance spectroscopy (UV-DRS), and temperature-programmed reduction (TPR) are used to characterize a series of TiO 2 / -Al 2 O 3 , NiO/ -Al 2 O 3 , and NiO/TiO 2 / -Al 2 O 3 samp
Preparation and characterization of dispersed “cobalt oxide” supported on γ-Al2O3
✍ Scribed by C-S. Bai; S. Soled; K. Dwight; A. Wold
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 378 KB
- Volume
- 91
- Category
- Article
- ISSN
- 0022-4596
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