๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Prediction of the threshold load of dislocation emission in silicon during nanoscratching

โœ Scribed by Fang, Q.H.; Zhang, L.C.


Book ID
122675608
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
893 KB
Volume
61
Category
Article
ISSN
1359-6454

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES