Prediction and characterization of compound phase formation at Ge-metal interfaces in thin film structures

✍ Scribed by T.K. Marais; E. Taylor; M. Ndwandwe; B. Spoelstra; R. Pretorias

• Book ID: 113285813
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 568 KB
• Volume: 85
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/0168-583x(94)95810-6