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Predicting the Failure Probability of Device Features in MEMS

โœ Scribed by D. M. Pierce; B. Zeyen; B. M. Huigens; A. M. Fitzgerald


Book ID
126645906
Publisher
IEEE
Year
2011
Tongue
English
Weight
903 KB
Volume
11
Category
Article
ISSN
1530-4388

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Many different fracture criteria have been proposed for the failure prediction of brittle materials using Ratdorf's or Evans weakest link formulation. There are also many reports where efforts have been made to determine which is the most suitable criterion. However, the difference between the predi