Predicting secondary ion formation in molecular dynamics simulations of sputtering
โ Scribed by B. Weidtmann; A. Duvenbeck; A. Wucher
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 156 KB
- Volume
- 255
- Category
- Article
- ISSN
- 0169-4332
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๐ SIMILAR VOLUMES
The normal bombardment of the targets consisted of single 13-, 27-or 39-atom copper cluster on a surface of polyethylene by Ar ions with energies of 100, 200 and 400 eV is examined using molecular dynamics simulation incorporating long-range many-body covalent bonding potential for hydrocarbons and
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