𝔖 Bobbio Scriptorium

✦ LIBER ✦

Predicting integrated circuit reliability via failure mechanisms : D. I. Troxel and B. Tiger. Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 217

Book ID: 103267520
Publisher: Elsevier Science
Year: 1968
Tongue: English
Weight: 202 KB
Volume: 7
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(68)90032-2

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