✦ LIBER ✦
The TEG — A test element for the control of quality and reliability of integrated circuits : E. A. Herr, D. W. Baker and A. Fox, Proc. 1968 Ann. Symp. Reliab., Boston, U.S.A. January (1968), p. 201
- Publisher
- Elsevier Science
- Year
- 1968
- Tongue
- English
- Weight
- 98 KB
- Volume
- 7
- Category
- Article
- ISSN
- 0026-2714
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