๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Precision X-Ray Techniques for Semiconductors

โœ Scribed by Macrander, A T


Book ID
121348231
Publisher
Annual Reviews
Year
1988
Tongue
English
Weight
762 KB
Volume
18
Category
Article
ISSN
0084-6600

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๐Ÿ“œ SIMILAR VOLUMES


precision x-ray measurements
โœ Kessler, E. G.; Deslattes, R. D.; Girard, D.; Schwitz, W.; Jacobs, L.; Renner, O ๐Ÿ“‚ Article ๐Ÿ“… 1982 ๐Ÿ› The American Physical Society ๐ŸŒ English โš– 498 KB
Software for precision x-ray diffraction
โœ R. G. Gerr; T. N. Borovskaya; I. V. Voloshina; N. N. Lobanov; O. L. Slovokhotova ๐Ÿ“‚ Article ๐Ÿ“… 1991 ๐Ÿ› SP MAIK Nauka/Interperiodica ๐ŸŒ English โš– 190 KB
High precision x-ray metrology
โœ P. Seyfried; P. Becker; D. Windisch ๐Ÿ“‚ Article ๐Ÿ“… 1988 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 612 KB