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Precision Measurement of the Charged Pion Mass by High Resolution X-Ray Spectroscopy

✍ Scribed by G. L. Borchert; B. Manil; D. Anagnostopoulos; J. P. Egger; D. Gotta; M. Hennebach; P. Indelicato; Y. W. Liu; N. Nelms; L. M. Simons

Book ID: 110308062
Publisher: Springer
Year: 2001
Tongue: English
Weight: 202 KB
Volume: 132
Category: Article
ISSN: 0304-3843
DOI: 10.1023/a:1011967821361

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