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Precise thickness and refractive index determination of polyimide films using attenuated total reflection

✍ Scribed by Lévesque, L. ;Paton, B. E. ;Payne, S. H.

Book ID
115343816
Publisher
The Optical Society
Year
1994
Tongue
English
Weight
525 KB
Volume
33
Category
Article
ISSN
1559-128X

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Determination of the refractive index and the thickness of thin-films using light interference have been presented. This has been done, for the first time, with the use of LloydÕs interferometer. The mean idea is based on using the sample in two different positions in the same interferometer. The me