✦ LIBER ✦

Precise measurement of the deep defects and surface states in a-Si:H films by absolute CPM

✍ Scribed by A. Fejfar; A. Poruba; M. Vaněček; J. Kočka

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Surface and bulk density of states analy

✍ G. Amato; G. Benedetto; L. Boarino; R. Spagnolo 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 276 KB

Characterization of the defect density a

✍ Manabu Sasaki; Shingo Okamoto; Yoshihiro Hishikawa; Shinya Tsuda; Shoichi Nakano 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 294 KB

Studies of defect states in the interfac

✍ Zhong Chen; Wenyuan Xu 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 250 KB

Bulk and surface defects in a-Si:H films

✍ A.H.M. Smets; J.H. van Helden; M.C.M. van de Sanden 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 211 KB

Surface states and in-depth inhomogeneit

✍ G. Grillo; L. De Angelis 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 178 KB

The density of gap states in single- and

✍ Daxing Han; Wei Li; Shenfa Quian; Changhua Qiu 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 180 KB