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Bulk and surface defects in a-Si:H films studied by means of the cavity ring down absorption technique

✍ Scribed by A.H.M. Smets; J.H. van Helden; M.C.M. van de Sanden

Book ID: 117145491
Publisher: Elsevier Science
Year: 2002
Tongue: English
Weight: 211 KB
Volume: 299-302
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(01)01026-2

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