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Practical correction procedures for elastic electron scattering effects in ARXPS

✍ Scribed by T.S. Lassen; S. Tougaard; A. Jablonski


Book ID
117215787
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
232 KB
Volume
481
Category
Article
ISSN
0039-6028

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✍ Jablonski, A.; Tougaard, S. πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 533 KB

We deÐne a new parameter to describe the e †ects of elastic electron scattering in XPS and AES. The parameter is the ratio of emitted intensity from a layer of atoms located at a given depth in a solid calculated from theories that take into account and neglect elastic electron scattering. We have f

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Elastic electron scattering in XPS and AES vary considerably with depth of origin of emitted electrons. To account for this, we introduced in a recent paper a simple correction factor CF. The function CF is the ratio of emitted peak intensity from a layer of atoms located at a given depth in a solid

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