We deΓne a new parameter to describe the e β ects of elastic electron scattering in XPS and AES. The parameter is the ratio of emitted intensity from a layer of atoms located at a given depth in a solid calculated from theories that take into account and neglect elastic electron scattering. We have f
Practical correction procedures for elastic electron scattering effects in ARXPS
β Scribed by T.S. Lassen; S. Tougaard; A. Jablonski
- Book ID
- 117215787
- Publisher
- Elsevier Science
- Year
- 2001
- Tongue
- English
- Weight
- 232 KB
- Volume
- 481
- Category
- Article
- ISSN
- 0039-6028
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π SIMILAR VOLUMES
Elastic electron scattering in XPS and AES vary considerably with depth of origin of emitted electrons. To account for this, we introduced in a recent paper a simple correction factor CF. The function CF is the ratio of emitted peak intensity from a layer of atoms located at a given depth in a solid
We have determined the surface plasmon excitation correction (SEC) factor for nickel in the 200-5000 eV range from the ratios of the absolute elastic scattering electron intensities measured by a novel cylindrical mirror analyser and those by the Monte Carlo method. The inelastic mean free paths (IM