Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment

✍ Scribed by Meng-Fan Wu; Jiun-Lang Huang; Xiaoqing Wen; Miyase, K.

• Book ID: 117908316
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 1008 KB
• Volume: 28
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2009.2030440