A Physical-Location-Aware X-Filling Method for IR-Drop Reduction in At-Speed Scan Test

✍ Scribed by Wen-Wen Hsieh; Shih-Liang Chen; I-Sheng Lin; TingTing Hwang

• Book ID: 117908364
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 639 KB
• Volume: 29
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2009.2035584