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Power dissipation and interconnect noise challenges in nanometer CMOS technologies

✍ Scribed by Ekekwe, Ndubuisi

Book ID: 120379894
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 1004 KB
Volume: 29
Category: Article
ISSN: 0278-6648
DOI: 10.1109/MPOT.2010.935825

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