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Possibilities and limitations of the film thickness determination method based on white light interference

✍ Scribed by Musilova, J; Ohlidal, I

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

7162. Possibilities and limitations of t

📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 149 KB

Film thickness monitor based on white li

✍ Sandercock, J R 📂 Article 📅 1983 🏛 Institute of Physics ⚖ 552 KB

Influence of defects of thin films on de

✍ Musilova, J; Ohlidal, I 📂 Article 📅 1992 🏛 Institute of Physics 🌐 English ⚖ 426 KB

Possibilities and limitations of the sty

✍ H.L. Eschbach; F. Verheyen 📂 Article 📅 1974 🏛 Elsevier Science 🌐 English ⚖ 707 KB

Possibilities of adjusting the light cha

✍ Gvozdev, S. M.; Karabin, A. B.; Libentsova, A. A. 📂 Article 📅 2010 🏛 Optical Society of America 🌐 English ⚖ 305 KB

Influence of defects of thin films on de

📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 149 KB