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Positron annihilation studies of electrodeposited copper layers

✍ Scribed by E. Dryzek; J. Dryzek

Book ID
110335885
Publisher
Springer
Year
2002
Tongue
English
Weight
334 KB
Volume
21
Category
Article
ISSN
0261-8028

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Positron annihilation studies within the standard methods in copper layers electrodeposited on the copper substrate are presented. The main interest was focused on the studies of the S-parameter evaluated from the annihilation line as a function of the thickness of the covered layer. The thickness o

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## Abstract Single‐crystalline GaN layers with a thickness up to 330 Β΅m were grown by hydride vapor phase epitaxy on basal plane sapphire at gallium stable conditions in a bottom‐fed vertical reactor at atmospheric pressure. Positron annihilation spectroscopy experiments were implemented in order t