Positron Absorption Studies in Electrodeposited Copper Layers

✍ Scribed by Dryzek, J. ;Dryzek, E.

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 154 KB
• Volume: 179
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200006)179:2<337::aid-pssa337>3.0.co;2-h

✦ Synopsis

Positron annihilation studies within the standard methods in copper layers electrodeposited on the copper substrate are presented. The main interest was focused on the studies of the S-parameter evaluated from the annihilation line as a function of the thickness of the covered layer. The thickness of the layer ranged from 5 to 250 mm and we were interested in the fraction of positrons absorbed in it. From that we tested two relations linking the local and the measured positron annihilation characteristics, and the positron implantation profile. The reasonable description of the experimental data was obtained when the fraction of positrons implanted in the layer was deduced from the exponential positrons profile averaged over a solid angle. The experimental studies have been performed with 22 Na and 68 Ge positron sources. The present considerations could be dedicated to positron studies of inhomogeneous solids.