A previous XPS and low mass resolution (quadrupole) SIMS study of methyl methacrylate-poly(ethylene glycol) methacrylate random copolymers indicated (by XPS) a surface composition close to that of the bulk, however the trends in SIMS intensity ratios for peaks chosen to represent the individual mono
Positive secondary ion mass spectrum of poly(methyl methacrylate): a high mass resolution ToF-SIMS study
✍ Scribed by Briggs, David; Fletcher, Ian W.; Gon�alves, Nancy M.
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 114 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0142-2421
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✦ Synopsis
The positive SIMS spectrum of poly(methyl methacrylate) (PMMA) has been obtained with a mass resolution in excess of 8000 and all the components assigned up to m/z 200 based on accurate mass measurements. Aspects of the interpretation of the spectrum, previously based on quadrupole SIMS data from a number of acrylic polymers, need to be revised significantly. In particular, the spectrum is dominated by oxygencontaining fragments derived from oligomeric units rather than hydrocarbon fragments derived from the polymer backbone. To aid further the understanding of the fragmentation of acrylic polymers, a less-detailed study of poly(methyl acrylate) has also been carried out.
📜 SIMILAR VOLUMES
This paper is concerned with the e †ects that polymer molecular weight, casting solvent, soniÐcation (with a nonpolymer solvent) and annealing have upon the secondary ion mass spectrometry (SIMS) of polymers. Films of a series of monodispersed poly(methyl methacrylate) (PMMA) standards, 2965-1 200