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Pore structure characterization of thin films using a surface acoustic wave/volumetric adsorption technique

✍ Scribed by Hietala, S. L.; Smith, D. M.; Hietala, V. M.; Frye, G. C.; Martin, S. J.

Book ID
127122152
Publisher
American Chemical Society
Year
1993
Tongue
English
Weight
389 KB
Volume
9
Category
Article
ISSN
0743-7463

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