𝔖 Bobbio Scriptorium

✦ LIBER ✦

Polymers in microelectronics fundamentals and applications: Authors: David S. Soane and Zoya Martynenko Publishers: Elsevier Science Publishers, Science and Technology Division, P.O. Box 330, 1000 AH Amsterdam, The Netherlands. Elsevier Science Publishing Co., Inc., P.O. Box 882, Madison Square Station, New York, New York 10159, United States of America. Price: US $ 95.00. Dfl. 225.00. (ISBN 0-444-87290-6). Published 1989

✍ Scribed by G.W.A.D.

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 115 KB
Volume: 30
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(90)90026-j

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Reliability of analogue electron systems

Reliability of analogue electron systems: Author: Klaas B. Klaassen Publishers: Elsevier Science Publishers B.V. Molenwerf 1, P.O. Box 330, 1000 AH, Amsterdam, The Netherlands. Elsevier Science Publishing Co., Inc., P.O. Box 1663, Grand Central Station, New York, New York 10163, United States of America. Price: U.S. $ 63.50. Dfl. 165.00. (ISBN 0-444-42388-5)

✍ G.W.A.D. 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 43 KB

High vacuum production in the microelect

High vacuum production in the microelectronics industry: Author: Pierre Duval Publishers: Elsevier Science Publishers, Sara Burgerhartstraat 25, P.O. Box 211, 1000 AE Amsterdam, The Netherlands. Elsevier Science Publishing Co., Inc., P.O. Box 1663, Grand Central Station, New York, NY 10163, United States of America. Price: US$ 86.75. Dfl. 165.00. (ISBN 0-444-42878-X). Published 1988

✍ G.W.A.D. 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 30 KB

Human reliability analysis, prediction,

Human reliability analysis, prediction, and prevention of human errors: Author: Kyung S. Park Publishers: Elsevier Science Publishers, Sara Burgerhartstraat 25, P.O. Box 211, 1000 AE Amsterdam, The Netherlands. Elsevier Science Publishing Co., Inc., P.O. Box 1663, Grand Central Station, New York, NY 10163, United States of America. Price: US $ 91.00. Dutch fl. 205.00. (ISBN 0-444-42727-9). Published 1987

✍ G.W.A.D. 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 115 KB

Absorbent polymer technology. Edited by

Absorbent polymer technology. Edited by L. BRANNON-PEPPAS and R. S. HARLAND. ISBN 0-444-88654-0. Amsterdam/Oxford/New York/Tokio: Elsevier 1990. 278 p., cloth bound, us $107.75/dfl. 210.00. (Available in the USA/Canada from Elsevier Science Publishing Co., Inc., P.O. Box 882, Madison Square Station, New York, NY 10159, U.S.A.)

✍ J. Hartmann 📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 215 KB

Process and device modelling for microel

Process and device modelling for microelectronics: Edited by: G. Baccarani Publishers: Elsevier Science Publishers, B.V. Sara Burgerhartstraat 25, P.O. Box 211, 1000 AE Amsterdam, the Netherlands. also P.O. Box 945, Madison Square Garden, New York, N.Y. 10160-0757, United States of America. Price: Df1. 350.00 (US$ 200.00). (ISBN 0-444-89962-6) Published August 1993

✍ G.W.A.D. 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 66 KB

New trends in system reliability evaluat

New trends in system reliability evaluation: Edited by: K.B. Misra Publishers: Elsevier Science Publishers P.O. Box 211, 1000 AE Amsterdam, The Netherlands and P.O. Box 945, Madison Square Station, New York, NY 10160-0757 United States of America. Price: D.fl. 425.00 Publication Date: December 1993 (ISBN 0-444-81660-7)

✍ G.W.A.D. 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 60 KB