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Polymer Anchoring Layer for Atomic Force Microscopy Studies of Nanoparticle-Substrate Interactions

✍ Scribed by Burtovyy, Ruslan; Liu, Yong; Luzinov, Igor; Zdyrko, Bogdan; Tregub, Alex; Moinpour, Mansour; Buehler, Mark

Book ID
121263206
Publisher
Taylor and Francis Group
Year
2007
Tongue
English
Weight
544 KB
Volume
46
Category
Article
ISSN
0022-2348

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Atomic Force Microscopy Studies of Membr
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✍ W. Richard Bowen; Teodora A. Doneva πŸ“‚ Article πŸ“… 2000 πŸ› Elsevier Science 🌐 English βš– 134 KB

Atomic force microscopy in conjunction with the colloid (silica) probe technique has been used to quantify the variations in electrical double-layer interactions and adhesion at different locations on a rough reverse osmosis membrane (AFC99) surface in NaCl solutions. Prior scanning of the membrane