The crystal structure of In 2 S 3 thin films obtained by the chemical vapor deposition method from the volatile complex compounds indium(III) isopropyl xanthate and indium(III) diethyl dithiocarbonate was studied by synchrotron radiation diffraction. High photon beam intensity (3 ؋ 10 10 photons/mm
✦ LIBER ✦
Polyaniline thin films – structural anisotropy study by use of synchrotron radiation surface diffraction
✍ Scribed by W. L̵użny; E.J. Samuelsen; D.W. Breiby
- Book ID
- 117537670
- Publisher
- Elsevier Science
- Year
- 2001
- Tongue
- English
- Weight
- 634 KB
- Volume
- 119
- Category
- Article
- ISSN
- 0379-6779
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