Polarized infrared reflectance studies for wurtzite InN epilayers on Si(111) grown by molecular beam expitaxy

✍ Scribed by P.K. Ooi; S.C. Lee; S.S. Ng; Z. Hassan; H. Abu Hassan; W.L. Chen

• Book ID: 113936896
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 353 KB
• Volume: 520
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2011.01.229