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p-polarized infrared attenuated total reflection study of InN thin films grown on Si(111) substrate

✍ Scribed by S. S. Ng; S. C. Lee; P. K. Ooi; Z. Hassan; H. Abu Hassan; W. L. Chen

Book ID: 112183017
Publisher: John Wiley and Sons
Year: 2010
Tongue: English
Weight: 192 KB
Volume: 4
Category: Article
ISSN: 1862-6254
DOI: 10.1002/pssr.201004173

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