๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Polarisation measurements in Raman spectroscopy

โœ Scribed by P. Dawson


Book ID
113372823
Publisher
Elsevier Science
Year
1972
Tongue
English
Weight
559 KB
Volume
28
Category
Article
ISSN
1386-1425

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Stress measurements in Si microelectroni
โœ Ingrid De Wolf ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 978 KB

The application of micro-Raman spectroscopy for the measurement of local stress in silicon microelectronics samples is discussed. Practical issues of concern for local stress measurements using micro-Raman spectroscopy are dealt with.