Point-defect associated thermionic hole emissions from p-type Si/Si1−xGex/Si quantum well structures

✍ Scribed by Keunjoo Kim; Hong Seub Kim; Hwack Joo Lee

• Publisher: Springer
• Year: 1999
• Tongue: English
• Weight: 630 KB
• Volume: 3
• Category: Article
• ISSN: 1432-8488
• DOI: 10.1007/s100080050176