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Plasmons at the interface between a corrugated semiconductor film and a binary metallic superlattice

✍ Scribed by J.H. Jacobo-Escobar; Xóchitl I. Saldaña; Gregorio H. Cocoletzi

Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
194 KB
Volume
28
Category
Article
ISSN
0749-6036

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✦ Synopsis

We investigate the minigaps of the dispersion relation of plasmon polaritons that propagate at the interface between a corrugated semiconductor film and a binary metallic superlattice. Minima of the reflectivity for p-polarized light are calculated and their frequencies are used to obtain the 'optical' dispersion relations which are compared with the corresponding electromagnetic dispersion curves, in the effective medium theory. Results show that the minigap enlarges with the corrugation strength.

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