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Plasma-Induced Damage in High-<formula formulatype="inline"><tex>$k$</tex></formula>/Metal Gate Stack Dry Etch

โœ Scribed by M. M. Hussain; S. Song; J. Barnett; C. Y. Kang; G. Gebara; B. Sassman; N. Moumen


Book ID
126743329
Publisher
IEEE
Year
2006
Tongue
English
Weight
256 KB
Volume
27
Category
Article
ISSN
0741-3106

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