On Oxygen Deficiency and Fast Transient Charge-Trapping Effects in High-<formula formulatype="inline"><tex>$k$</tex></formula> Dielectrics

✍ Scribed by H. Wen; H. Rusty Harris; C. D. Young; H. Luan; H. N. Alshareef; K. Choi; D. Kwong; P. Majhi; G. Bersuker; B. H. Lee

• Book ID: 124161005
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 400 KB
• Volume: 27
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/LED.2006.886711