PL and XPS study of radiation damage created by various slow highly charged heavy ions on GaN epitaxial layers

✍ Scribed by L.Q. Zhang; C.H. Zhang; J. Gou; L.H. Han; Y.T. Yang; Y.M. Sun; Y.F. Jin

• Book ID: 113823628
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 514 KB
• Volume: 269
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2011.08.001