HRXRD, AFM and optical study of damage created by swift heavy ion irradiation in GaN epitaxial layers

✍ Scribed by N. Sathish; S. Dhamodaran; A.P. Pathak; M. Ghanashyam Krishna; S.A. Khan; D.K. Avasthi; A. Pandey; R. Muralidharan; G. Li; C. Jagadish

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 711 KB
• Volume: 256
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2006.12.060