Picosecond transient grating measurement of orientational effects in semiconductors
โ Scribed by Thomas F. Boggess; Arthur L. Smirl; B.S. Wherrett
- Publisher
- Elsevier Science
- Year
- 1982
- Tongue
- English
- Weight
- 567 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0030-4018
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