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Physically based model for trapping and self-heating effects in 4H-SiC MESFETs

✍ Scribed by Hongliang Lu; Yimen Zhang; Yuming Zhang; Yong Che; Quanjun Cao; Shaojin Zheng


Book ID
106020935
Publisher
Springer
Year
2008
Tongue
English
Weight
394 KB
Volume
91
Category
Article
ISSN
1432-0630

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