Physical Principles of Electron Microscopy
✍ Scribed by R.F. Egerton
- Book ID
- 127454986
- Publisher
- Springer
- Year
- 2005
- Tongue
- English
- Weight
- 5 MB
- Edition
- Springer
- Category
- Library
- ISBN
- 0387260161
No coin nor oath required. For personal study only.
✦ Synopsis
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.
✦ Subjects
Практикумы, экспериментальная физика и физические методы исследования
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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microsc
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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microsc
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