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✦   LIBER   ✦

Physical Principles of Electron Microscopy

✍ Scribed by R.F. Egerton


Book ID
127454986
Publisher
Springer
Year
2005
Tongue
English
Weight
5 MB
Edition
Springer
Category
Library
ISBN
0387260161

No coin nor oath required. For personal study only.

✦ Synopsis


Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

✦ Subjects


Практикумы, экспериментальная физика и физические методы исследования


📜 SIMILAR VOLUMES


Physical Principles of Electron Microsco
✍ Egerton, Ray F. 📂 Article 📅 2005 🏛 Springer US 🌐 English ⚖ 380 KB

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microsc

Physical Principles of Electron Microsco
✍ Egerton, Ray F. 📂 Article 📅 2005 🏛 Springer US 🌐 English ⚖ 341 KB

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microsc

Physical Principles of Electron Microsco
✍ Egerton, Ray F. 📂 Article 📅 2005 🏛 Springer US 🌐 English ⚖ 983 KB

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microsc

Physical Principles of Electron Microsco
✍ Egerton, Ray F. 📂 Article 📅 2005 🏛 Springer US 🌐 English ⚖ 323 KB

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microsc