๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Physical Principles of Electron Microscopy Volume 96 || The Transmission Electron Microscope

โœ Scribed by Egerton, Ray F.


Book ID
111911986
Publisher
Springer US
Year
2005
Tongue
English
Weight
323 KB
Edition
1
Category
Article
ISBN
0387260161

No coin nor oath required. For personal study only.

โœฆ Synopsis


Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.


๐Ÿ“œ SIMILAR VOLUMES


Physical Principles of Electron Microsco
โœ Egerton, Ray F. ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› Springer US ๐ŸŒ English โš– 380 KB

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microsc

Physical Principles of Electron Microsco
โœ Egerton, Ray F. ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› Springer US ๐ŸŒ English โš– 341 KB

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microsc

Physical Principles of Electron Microsco
โœ Egerton, Ray F. ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› Springer US ๐ŸŒ English โš– 983 KB

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microsc