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Photothermal model fitting in the complex plane for thermal properties determination in solids

✍ Scribed by Zambrano-Arjona, M. A.; Peñuñuri, F.; Acosta, M.; Riech, I.; Medina-Esquivel, R. A.; Martínez-Torres, P.; Alvarado-Gil, J. J.

Book ID
120304601
Publisher
American Institute of Physics
Year
2013
Tongue
English
Weight
734 KB
Volume
84
Category
Article
ISSN
0034-6748

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The photothermal method has been used in order to determine the thermal properties of semiconductors. In this work, a simple expression for the periodic temperature, at the sample's surface, which is valuable for a number of layers deposited on a substrate, was introduced. This expression showed a v