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Photothermal deflection microscopy for imaging sub-micronic defects in optical materials

✍ Scribed by Annelise During; Caroline Fossati; Mireille Commandré

Book ID: 104072626
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 316 KB
Volume: 230
Category: Article
ISSN: 0030-4018
DOI: 10.1016/j.optcom.2003.11.040

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