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Photon-Assisted Oxygen Diffusion and Oxygen-Related Traps in Organic Semiconductors

โœ Scribed by Hikmet Najafov; Daniel Mastrogiovanni; Eric Garfunkel; Leonard C. Feldman; Vitaly Podzorov


Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
355 KB
Volume
23
Category
Article
ISSN
0935-9648

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๐Ÿ“œ SIMILAR VOLUMES


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โœ R.J. Lauf; C.J. Altstetter ๐Ÿ“‚ Article ๐Ÿ“… 1979 ๐Ÿ› Elsevier Science โš– 622 KB

The diffusion coefficient of oxygen has been measured in niobium, vanadium and several dilute substitutional niobium alloys. Measurements were made over the range of 6@I-1150ยฐC (873-1423 K) using a solid electrolytic cell technique. Oxygen diffusivity in the alloys was found to be less than in pure

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โœ Bean, John W. ๐Ÿ“‚ Article ๐Ÿ“… 1941 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 559 KB

## ONE FIGURE I n the acute oxygen poisoning of vertebrates the toxicity of oxygen at high pressures, aside from its relatively minor influence on pulmonary epithelium in these short exposures, may be attributed to two effects. The first and in all probability the most outstanding action of oxygen