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Photoluminescence of LiF crystal colored by a focused electron beam

โœ Scribed by G. Baldacchini; M. Cremona; R.M. Montereali; L.C. Scavarda do Carmo; R.A. Nunes; S. Paciornik; F. Somma; V. Kalinov


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
253 KB
Volume
94
Category
Article
ISSN
0030-4018

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## Abstract Energetic beams of electrons and ions are widely used to probe the microscopic properties of materials. Irradiation with charged beams in scanning electron microscopes (SEM) and focused ion beam (FIB) systems may result in the trapping of charge at irradiation induced or preโ€existing de