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Photoluminescence as a probe of semiconductor surfaces: CdTe and CdS

✍ Scribed by Z. Sobiesierski; I.M. Dharmadasa; R.H. Williams


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
351 KB
Volume
101
Category
Article
ISSN
0022-0248

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Optical techniques, in particular photoluminescence (PL) spectroscopies, are currently used as a probe of the sample properties in semiconductor physics. The information obtained from the combined study of the near band-edge radiative recombination, i.e. of the free-carrier, free exciton (FE) and bo