Free-Exciton Photoluminescence as a Probe of CVD Diamond

✍ Scribed by Bogani, F. ;Miglio, S. ;Sciortino, S. ;Taschin, A. ;Vinattieri, A.

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 84 KB
• Volume: 181
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200009)181:1<23::aid-pssa23>3.0.co;2-i

✦ Synopsis

Optical techniques, in particular photoluminescence (PL) spectroscopies, are currently used as a probe of the sample properties in semiconductor physics. The information obtained from the combined study of the near band-edge radiative recombination, i.e. of the free-carrier, free exciton (FE) and bound exciton PL, by means of both spectrally-resolved and time-resolved photoluminescence allows a reconstruction of the carrier dynamics and provides a good test of the sample device quality. The present availability of laser sources delivering femtosecond pulses with a photon energy greater than 5.5 eV, i.e. of the diamond indirect band-edge, allows now the application of such techniques to the characterisation of diamond samples. In fact good quality CVD diamond films exhibit a free-exciton recombination which can be used as a probe of their quality. The technique has been used in the present study for the characterisation of virgin and neutron irradiated CVD diamond samples.