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Photoluminescence and x-ray diffraction measurements of InN epifilms grown with varying In∕N ratio by plasma-assisted molecular-beam epitaxy

✍ Scribed by Yao, Yong-zhao; Sekiguchi, Takashi; Ohashi, Naoki; Adachi, Yutaka; Ohgaki, Takeshi

Book ID: 121791860
Publisher: American Institute of Physics
Year: 2008
Tongue: English
Weight: 444 KB
Volume: 92
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2937833

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