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Photoelectron spectroscopy and microscopy of carbon nanotubes

โœ Scribed by Satoru Suzuki; Yoshio Watanabe; Stefan Heun

Book ID
116386640
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
431 KB
Volume
10
Category
Article
ISSN
1359-0286

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Angle-dependent x-ray absorption near edge structure (XANES) and scanning photoelectron microscopy (SPEM) measurements have been performed to differentiate local electronic structures of the tips and sidewalls of highly aligned carbon nanotubes. The intensities of both ฯ€\*- and ฯƒ\*-band Cโ€ŠK-edge XAN