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Electronic structure of the carbon nanotube tips studied by x-ray-absorption spectroscopy and scanning photoelectron microscopy

โœ Scribed by Chiou, J. W.; Yueh, C. L.; Jan, J. C.; Tsai, H. M.; Pong, W. F.; Hong, I.-H.; Klauser, R.; Tsai, M.-H.; Chang, Y. K.; Chen, Y. Y.; Wu, C. T.; Chen, K. H.; Wei, S. L.; Wen, C. Y.; Chen, L. C.; Chuang, T. J.


Book ID
120752609
Publisher
American Institute of Physics
Year
2002
Tongue
English
Weight
608 KB
Volume
81
Category
Article
ISSN
0003-6951

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Electronic structure of the carbon nanot
โœ Chiou, J. W.; Yueh, C. L.; Jan, J. C.; Tsai, H. M.; Pong, W. F.; Hong, I.-H.; Kl ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› American Institute of Physics ๐ŸŒ English โš– 608 KB

Angle-dependent x-ray absorption near edge structure (XANES) and scanning photoelectron microscopy (SPEM) measurements have been performed to differentiate local electronic structures of the tips and sidewalls of highly aligned carbon nanotubes. The intensities of both ฯ€\*- and ฯƒ\*-band Cโ€ŠK-edge XAN