Electronic structure of the carbon nanot
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Chiou, J. W.; Yueh, C. L.; Jan, J. C.; Tsai, H. M.; Pong, W. F.; Hong, I.-H.; Kl
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Article
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2002
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American Institute of Physics
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English
โ 608 KB
Angle-dependent x-ray absorption near edge structure (XANES) and scanning photoelectron microscopy (SPEM) measurements have been performed to differentiate local electronic structures of the tips and sidewalls of highly aligned carbon nanotubes. The intensities of both ฯ\*- and ฯ\*-band CโK-edge XAN