๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Phase stability of hafnium oxide and zirconium oxide on silicon substrate

โœ Scribed by Dongwon Shin; Zi-Kui Liu


Book ID
113896730
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
177 KB
Volume
57
Category
Article
ISSN
1359-6462

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Growth and characterization of zirconium
โœ P.Y. Kuei; J.D. Chou; C.T. Huang; H.H. Ko; S.C. Su ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 843 KB

The growth and characterization of zirconium oxide (ZrO 2 ) thin films prepared by thermal oxidation of a deposited Zr metal layer on SiO 2 /Si were investigated. Uniform ZrO 2 thin film with smooth surface morphology was obtained. The thermal ZrO 2 films showed a polycrystalline structure. The diel