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Phase shifting nano-moiré method with scanning tunneling microscope

✍ Scribed by Haixia Shang; Huimin Xie; Zhanwei Liu; Haiming Guo; Hongjun Gao; Fulong Dai


Book ID
108401977
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
434 KB
Volume
41
Category
Article
ISSN
0143-8166

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In this paper, a phase-shifting grating microscope method is proposed for the deformation measurement with high sensitivity and spatial resolution. The grating image is shifted by the slab refraction eect, and is realized via a tilting compensator. A microscope is reconstructed to perform the tensio